Miller is a senior staff engineer at Sun Microsystems. He attended Columbia University where he received his M. Frequency-domain Characterization of Power Distribution Networks. Istvan Novak , Jason R.
Power distribution networks PDNs are key components in today's high-performance electronic circuitry. Here is how and why.
Power distribution networks PDNs delivering power to ICs in a system need to be thoroughly designed and analyzed in order to make sure any voltage fluctuation on the rail is within the tolerance of every IC connected to that rail. As ICs on the rail draw power, they generate a voltage fluctuation on the rail.
Frequency-domain Characterization of Power Distribution Networks
The PDN must have the capacity to supply enough charge such that the resulting voltage drop is less than the maximum voltage drop each IC on the rail can tolerate. If voltage fluctuations appear outside IC tolerance limits, a slew of problems can surface such as IC damage, failure, or reduced lifespan.
DesignCon has been a tremendous source of information for myself and for the team I have been working with at SUN Microsystems, which later became part of Oracle Corporation. This summary is an attempt to capture some of the most influential papers from the past twenty years that made the biggest impact on our work.
This paper, presented at EDI CON USA , demonstrates the use of a special probe tip utilized to convert a differential measurement of inductor voltage to a measurement of inductor current. It shows the connection and calibration considerations in the measurement of inductor current, including the digital signal processing algorithms required to compensate for the components in the power supply and the probe tip.
- Whos Who in Orthopedics;
- Becoming Criminal: Transversal Performance and Cultural Dissidence in Early Modern England!
- The Jews as a chosen people: tradition and transformation!
- Five Past Midnight.
- MATLAB Differential and Integral Calculus.
It also explains current sharing measurements made in the time and frequency domain using a transient current generator. Microwave engineers know that sharp corners and right-angle bends have their drawback at high frequencies. So what happens if we go to the other extreme of the spectrum, to DC?
CNU - 一种单层片式瓷介电容器高频s参数测试夹具 - Google Patents
Istvan Novak takes a closer look. We have to use enough capacitors so that the PDN functions properly. New York: Wiley. Outline Index. Descriptive statistics.
Mean arithmetic geometric harmonic Median Mode. Central limit theorem Moments Skewness Kurtosis L-moments. Index of dispersion. Grouped data Frequency distribution Contingency table. Pearson product-moment correlation Rank correlation Spearman's rho Kendall's tau Partial correlation Scatter plot.
- Frequency domain - Wikipedia.
- CN205384297U - 一种单层片式瓷介电容器高频s参数测试夹具 - Google Patents!
- Misdiagnosed: One Womans Tour of - And Escape From - Healthcareland!
- Thin Laminates as Embedded Capacitance for PDN Designs | DuPont Electronic Solutions.
- Account Options.
Data collection. Sampling stratified cluster Standard error Opinion poll Questionnaire. Scientific control Randomized experiment Randomized controlled trial Random assignment Blocking Interaction Factorial experiment.
Adaptive clinical trial Up-and-Down Designs Stochastic approximation. Cross-sectional study Cohort study Natural experiment Quasi-experiment. Statistical inference. Z -test normal Student's t -test F -test. Bayesian probability prior posterior Credible interval Bayes factor Bayesian estimator Maximum posterior estimator. Correlation Regression analysis.
Pearson product-moment Partial correlation Confounding variable Coefficient of determination. Simple linear regression Ordinary least squares General linear model Bayesian regression. Regression Manova Principal components Canonical correlation Discriminant analysis Cluster analysis Classification Structural equation model Factor analysis Multivariate distributions Elliptical distributions Normal. Spectral density estimation Fourier analysis Wavelet Whittle likelihood.